MK.4TE ESD and Latch-Up Test System

• Pin count : 1152, 1728 and 2304 pins
• Test mode : HBM, MM and Latch up
• Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
• Relay based System
• High throughput
• Vector

MK.2-TE ESD and Latch-Up Test System

• Pin count : 128, 256, 384, 512 and 768 pins
• Test mode : HBM, MM and Latch up
• Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
• Relay based System
• High throughput.
• Vector

MK.1TE Low Pin Count ESD and Latch-Up Test System

• Pin count : 64, 128 192 and 256pins
• Test mode : HBM, MM and Latch up
• Standard: JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
• Relay based System
• High throughput

Pegasus 2-Pin ESD /Curve Trace Test System

• ESD test for wafer and package
• Test mode : HBM, MM and HMM
• Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
• Pre/post VI curve function
• Actual voltage and Current waveform capture function
• High throughput.
• VI bias (optional)

Orion3™ Electrostatic Discharge (ESD) Tester, CDM(charged device model

• FICDM(Field Induced CDM tester)
• LI-CCDM (Low impedance Contact CDM)
• Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-002
• High speed
• High resolution camera

Celestron™ Flexible Bench Top TLP/VF-TLP Test System

• TLP(Transmission Line Pulse), VF−TLP(Very Fast Transmission Line Pulse)
• TLP measurement on wafer and package