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SEMICONDUCTOR

Thermo Fisher Scientific

MK.4TE

MK.4TE ESD and Latch-Up Test System

  • Pin count : 1152, 1728 and 2304 pins
  • Test mode : HBM, MM and Latch up
  • Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
  • Relay based System
  • High throughput
  • Vector

MK.2TE

MK.2-TE ESD and Latch-Up Test System

  • Pin count : 128, 256, 384, 512 and 768 pins
  • Test mode : HBM, MM and Latch up
  • Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
  • Relay based System
  • High throughput.
  • Vector

MK.1TE

MK.1TE Low Pin Count ESD and Latch-Up Test System

  • Pin count : 64, 128 192 and 256pins
  • Test mode : HBM, MM and Latch up
  • Standard: JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
  • Relay based System
  • High throughput

PEGASUS

Pegasus 2-Pin ESD /Curve Trace Test System

  • ESD test for wafer and package
  • Test mode : HBM, MM and HMM
  • Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-001
  • Pre/post VI curve function
  • Actual voltage and Current waveform capture function
  • High throughput.
  • VI bias (optional)

Orion3

Orion3™ Electrostatic Discharge (ESD) Tester, CDM(charged device model

  • FICDM(Field Induced CDM tester)
  • LI-CCDM (Low impedance Contact CDM)
  • Standard : JEDEC, AEC, ANSI/ESDA/JEDEC JS-002
  • High speed
  • High resolution camera

Celestron

Celestron™ Flexible Bench Top TLP/VF-TLP Test System

  • TLP(Transmission Line Pulse), VF−TLP(Very Fast Transmission Line Pulse)
  • TLP measurement on wafer and package